Lim S.-H., Hyun O.-B., Yim S.-W., Hwang S.-D., Kishio K.(tkishio@mail.ecc.u-tokyo.ac.jp), Sohn S.-H.
Ключевые слова: FCL resistive, Bi2223/Ag, tapes, YBCO, films, substrate sapphire, ac performance, overcurrent, quench protection, experimental results, power equipment
Ключевые слова: HTS, YBCO, substrate sapphire, FCL resistive, experimental results, power equipment
Chiba M., Nitta T.(nitta@asc.t.u-tokyo.ac.jp), Baba J., Morisue S.(morisue@asc.t.u-tokyo.ac.jp)
Furuse M., Nakagawa Y., Yamasaki H.(h.yamasaki@aist.go.jp), Kaiho K., Arai K.
Ключевые слова: FCL resistive, HTS, YBCO, films epitaxial, substrate sapphire, design parameters, economic analysis, experimental results, power equipment
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, crack formation, Jc/B curves, thickness dependence, fabrication, critical caracteristics
Sohma M., Kondo W., Tsukada K., Mizuta S., Kumagai T., Manabe T., Kamiya K., Yamaguchi I.(i-yamaguchi@aist.go.jp)
Ключевые слова: HTS, YBCO, films epitaxial, substrate sapphire, buffer layers, MOD process, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, mechanical properties, thermal stress, substrate sapphire, PLD process, microstructure, fabrication
Ключевые слова: HTS, YBCO, films, substrate sapphire, meander, FCL resistive, FCL inductive, quench properties, experimental results, power equipment
Ключевые слова: HTS, REBCO, films epitaxial, buffer layers, PLD process, substrate sapphire, microstructure, fabrication
Yamasaki H., Nie J.C.(jcnie@bnu.edu.cn)
Ключевые слова: HTS, YBCO, substrate sapphire, buffer layers, nanodots, pinning centers, Jc/B curves, fabrication, critical caracteristics
Ключевые слова: HTS, YBCO, films, meander, substrate sapphire, resistance, time evolution, quench properties, FCL resistive, experimental results, power equipment
Utz B., Kraemer H.-P., Neumueller H.-W., Schmidt W.(wolfgang.schmidt@siemens.com), Wacker B., Ahlf G., Hartig R.(reiner.hartig@siemens.com)
Ключевые слова: FCL resistive, HTS, YBCO, films, substrate sapphire, meander, nitrogen liquid , voltage waveforms, resistance, time evolution, thermal performance, quench current, test results, dc performance, power equipment
Ключевые слова: FCL resistive, YBCO, films, heterostructures, substrate sapphire, meander, resistance, time evolution, dissipative properties, test results, power equipment, new
Ключевые слова: FCL resistive, quench properties, HTS, YBCO, films, substrate sapphire, meander, resistance, time evolution, experimental results, power equipment, quench protection
Amemiya N., Miyashita M., Umeda S., Nagao S., Kubota H.(hiroshi2.kubota@toshiba.co.jp)
Ключевые слова: FCL resistive, HTS, YBCO, films, substrate sapphire, control systems, time evolution, current distribution, experimental results, power equipment, lateral effects
Lee B.W., Sim J., Kim H.-R., Hyun O.-B.(hyun@kepri.re.kr), Jung Y.-H., Park K.-B.(kbpark@lgis.com), Kang J.-S., Oh I.-S.
Ключевые слова: FCL resistive, HTS, YBCO, films, FCL three-phase, substrate sapphire, spiral lines, test results, control systems, fabrication, test results, power equipment
Lim S.-H., Choi H.-S., Han B.-S., Hyun O.-B., Chung D.-C., Sung T.-H.(sungth@kepri.re.kr), Hwang J.-S.(jshwang@namdo.ac.kr)
Ключевые слова: FCL resistive, HTS, YBCO, films, FCL three-phase, substrate sapphire, voltage drops, experimental results, power equipment
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